Carbon Design Innovations, Inc. introduces new probe technology for high aspect ratio imaging with their new TN-HAR series.
BURLINGAME, CA, March 31, 2015 /24-7PressRelease/ -- Every atomic force microscope (AFM) needs high aspect ratio (HAR) capability at least some of the time. The new TN series of HAR probes from Carbon Design Innovations, Inc. (CDI) are for samples 25nm or taller. TN-HAR probe technology is unlike any previous atomic force microscope (AFM) probe in the market. All scanning probe microscope (SPM) and AFM probes of the TN-HAR series are made from a proprietary Carbon based composite material with the stability of Silicon but the toughness of Carbon. They are chemically inert and offer a highly reproducible long-lasting HAR probe. The tip is shaped like a needle with a circular cross-section.
Without TN-HAR Series tips from CDI your AFM data may be giving you the wrong image. Up to 60% or more of your collected data may be incorrect. AFM users become accustomed to tip-induced artifacts that plague most AFM images but TN-HAR Series tips eliminate 90% of these artifacts. If your sample is as flat as a crystal surface then you don't need an HAR tip. For everything else, you need CDI's TN-HAR line of probe tools for AFM. TN-HAR tips last longer than Silicon tips, making your data more reliable scan to scan and cheaper to run on a cost per scan basis than even the "budget" probe options.
Description:
CDI TN-HAR Series probes with carbon nanotube (CNT) tips are designed for non-contact or tapping mode imaging. This probe type combines high Aspect Ratio with outstanding Lifetime and High Resolution.
Intended measurements on samples with sidewall angles up to 90 degree the tips show a high aspect ratio portion of up to 2 microns with near-vertical sidewalls. Typical aspect ratios TN Series tips can be as high as 20:1. The half cone angle is typically less than 1.5 degree.
About Carbon Design Innovations, Inc.
Carbon Design Innovations develops and manufactures carbon nanotube devices based on a patented, deterministic methodology. The company's initial focus is on manufacturing AFM probes.
The company was founded by AFM and CNT industry veteran and company president, Ramsey M. Stevens in January, 2008. The Director of Sales and Board of Directors all have extensive semiconductor backgrounds, coupled with AFM experience.
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Is your AFM Tip Tall Enough? - CDI Introduces New AFM Probes
March 31, 2015 at 03:00 AM EDT
